Е. А. Герлиц
Цена: 50 руб.
Критерий тестового покрытия MC/DC широко применяется для тестирования критических по безопасности систем, встраиваемых систем и прежде всего систем авионики. В данной работе мы рассматриваем ряд проблем, возникающих на практике при измерении тестового покрытия по MC/DC программ, написанных на языке Си, а также приводим возможные решения данных проблем. Выбранные решения влияют на качество тестирования. Данная статья содержит часть результатов нашей работы по исследованию методов тестирования инструментов для анализа тестового покрытия по критерию MC/DC для языков Си/C++.
Kлючевые слова: MC/DC, критерий тестового покрытия, DO-178B, язык Си,
системы авионики, тестирование
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